X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

• Autoři: NEUHOLD A; NOVÁK Jiří; FLESCH H G; MOSER Armin; DJURIC T; GRODD L; GRIGORIAN S; PIETSCH U; RESEL R
• Rok publikování: 2012
• Druh: Článek v odborném periodiku
• Doi: https://doi.org/10.1016/j.nimb.2011.07.105
• Klíčová slova: Radiation damage; Organic semiconductor; Grazing incidence X-ray diffraction; Fluence