Informace o projektu
Laboratoř tenkých vrstev a nanostruktur
- Kód projektu
- VS96102
- Období řešení
- 7/1996 - 12/2000
- Investor / Programový rámec / typ projektu
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Ministerstvo školství, mládeže a tělovýchovy ČR
- Posílení výzkumu na vysokých školách
- Fakulta / Pracoviště MU
- Přírodovědecká fakulta
Founding of a research laboratory for studies of thin-film systems and nanostructures attached to the Department of Solid State Physics at Faculty of Science, MU Brno. Selection of up-to-date topics backed by the experience of the Department, focusing onthe experimental methods competitive on the international scale, exploiting of the existing collaboration with domestic and foreign institutions. Some of the proposed research is founded by running grants. The immediate start of the activities of theLaboratory assumes several specific tasks of optical and X-ray studies of the SiGeC layers, quantum wells and superlattices of the GaAlInAsP systém, metallic multilayers, superconducting and polymer films. The scientific team of the Laboratory willcosnsist of four newly appinted, young physicsists, and four members of the Department.
Publikace
Počet publikací: 25
2002
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Strain in buried quantum wires: Analytical calculations and x-ray diffraction study
Phys. Rev. B, rok: 2002, ročník: 2002, vydání: 66
2001
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Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings
J. Phys. D: Appl. Phys., rok: 2001, ročník: 34, vydání: 10A
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GID study of strains in Si due to patterned SiO2
J. Phys. D: Appl. Phys., rok: 2001, ročník: 34, vydání: 10A
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Structural investigations on self-organized Si/SiGe islands by grazing incidence small angle X-ray scattering
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TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature
Materials Science and Engineering, rok: 2001, ročník: 80, vydání: 1-3
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Thermal stability of partially crystalline Nb/Si multilayers
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X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires
J. Phys. D: Appl. Phys., rok: 2001, ročník: 34, vydání: 10A
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X-ray diffraction from CuPt-ordered III-V ternary semiconductor alloy films
Phys. Rev. B, rok: 2001, ročník: 63, vydání: 15
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X-ray reflectivity from self-assembled structures in Ge/Si superlattices
J. Phys.D.: Appl. Phys., rok: 2001, ročník: 34, vydání: 10A
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X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy
Journal of Applied Physics, rok: 2001, ročník: 89, vydání: 9